翻訳と辞書 |
scan design (Or "Scan-In, Scan-Out") A electronic circuit design technique which aims to increase the controllability and observability of a digital {logic circuit} by incorporating special "{scan registers}" into the circuit so that they form a scan path. Some of the more common types of scan design include the {multiplexed register} designs and level-sensitive scan design (LSSD) used extensively by IBM. Boundary scan can be used alone or in combination with either of the above techniques. ["Digital Systems Testing and Testable Design" by Abramovici, Breuer, and Friedman, ISBN 0-7167-8179-4]. ["Design of Testable Logic Circuits" by R.G. Bennetts, (Brunel/Southhampton Universities), ISBN 0-201-14403-4]. (1995-02-23)
スポンサード リンク
翻訳と辞書 : 翻訳のためのインターネットリソース |
Copyright(C) kotoba.ne.jp 1997-2016. All Rights Reserved.
|
|